2010 IEEE International Conference on Imaging Systems and Techniques
Thessaloniki, Greece, 1-2 July 2010

Abstract due: 21 Feb. 2010
Notification of acceptance: 10 March 2010
Full paper due: 5 May 2010

Following the success of IEEE Workshops on Imaging Systems and Techniques, Stresa, Italy in 2004, Niagara Falls, Canada in 2005, Minori, Italy in 2006, Krakow, Poland in 2007, Chania, Island of Crete, Greece in 2008, and Shenzhen, China, in 2009, the 2010 IEEE Conference on Imaging Systems and Techniques (IST 2010) will take place in Thessaloniki, Greece.

IST 2010 deals with the design, development, evaluation and applications of imaging systems, instrumentation, and measuring techniques, to enhance detection and image quality. Applications for aerospace, medicine and biology, molecular imaging, metrology, ladar and lidars, radars, homeland security, and industrial imaging with emphasis on industrial tomography, corrosion imaging, and non-destructive evaluation (NDE) will be covered. The following areas will be particularly considered:

* Detector design principles and image formation
* Imaging system design and instrumentation
* Signal and image analysis
* Linear and non-linear processing techniques
* Medical imaging and bio-nano-photonics
* Environmental monitoring, energy resources
* Molecular imaging and metabolic imaging
* Remote sensing, passive and active sensing
* Ladars and Lidars
* Multispectral Polarimetric Imaging and Lasers
* Subsurface inspection, corrosion imaging
* Radiation detection, airport security and cargo
* Inspection-standoff detection techniques
* Electromagnetic imaging and inverse scattering